Hantek HDL2512B+ DC Electronic Load

The Hantek HDL2500+ Series redefines the capabilities of modern DC electronic loads by integrating powerful visualization and advanced testing functions. These instruments go beyond simple loading by featuring an innovative real-time oscillating function that displays voltage and current waveforms, which can be recorded, stored, and played back for detailed analysis. A large 4.3-inch color LCD provides a clear and intuitive user experience, while high-resolution measurement (up to 0.1mV / 0.1mA) ensures the utmost accuracy when testing the performance of any device under test.

Key Features

Dynamic Waveform Analysis

The standout feature of the HDL2500+ series is its ability to function like an oscilloscope. It accurately captures and displays dynamic voltage and current waveforms in real time, allowing engineers to visualize transient responses, ripple, and other critical characteristics without needing a separate instrument.

Comprehensive Test Modes

The series provides four fundamental operating modes to meet diverse testing requirements:

• Constant Current (CC)
• Constant Voltage (CV)
• Constant Resistance (CR)
• Constant Power (CP)

Advanced Automated Testing

To streamline the testing process, the HDL2500+ series is equipped with a suite of intelligent functions:

• OCP/OPP Testing: Automatically captures Over-Current Protection and Over-Power Protection points and determines pass/fail results based on set specifications.
• Arbitrary Current Simulation: Accurately simulates complex and high-speed arbitrary current patterns for precision testing.
• Rise/Fall Time & Ripple Measurement: Includes built-in functions to test voltage rise/fall times and measure ripple, further reducing the need for additional test equipment.

Seamless Integration

Designed for modern labs and automated test environments, the series comes standard with LAN, RS-232, and USB remote communication interfaces. It is also compatible with the SCPI protocol of mainstream manufacturers, ensuring easy integration into existing test systems.